先进测试技术实验室——

Chinese Version

Dr. Wenjing Rao (from University of Illinois at Chicago) gave a talk ( 2010.08.30 ) Yan's paper accepted by ISCA 2010 ( 2010.03.03 ) Dr. Laung-Terng (L.-T.) Wang (from SynTest) gave a talk. ( 2009.11.20 ) Dr. Li Shang (from University of Colorado at Boulder) gave a talk ( 2009.08.20 ) Dr. Yu Huang (from Mentor Graphics) gave a talk ( 2008.12.31 ) Dr. Dong Tang (from Sun Microsystems) gave a talk ( 2008.12.30 ) Dr. T.W.Williams and Dr. Rohit Kapur (from Synopsys) visited lab. ( 2008.11.22 )
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Prof. Xiaowei Li, Dr. Yinhe Han, et.al attended DATE'10 ( 2010.03.31 ) Dr. Tao Lv attended ASP-DAC'10 ( 2010.03.03 ) Prof. Xiaowei Li, Ms.Tao Lv, Mr.Jianliang Gao attended VTS'09 ( 2009.05.12 ) Dr. Yinhe Han and Mr. Guihai Yan attended DATE'09 ( 2009.05.05 ) Miss Jia Li attended ICCAD'08 ( 2008.11.17 ) Prof.Xiaowei Li, Dr.Yu Hu attended ITC'08 ( 2008.11.03 ) Prof.Xiaowei Li, Dr.Huawei Li, Mr.Minjin Zhang attended VTS'08 ( 2008.07.25 )
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13th Chinese Fault Tolerance Conference ( 2010.01.08 ) 5th China Test Conference (CTC'08) ( 2010.01.07 ) 12th China Fault-Tolerant Computing Symposium (CFTCS'07) ( 2010.01.06 ) 4th China Test Conference (CTC'2006) ( 2010.01.06 ) 11th China Fault-Tolerant Computing Symposium (CFTCS'2005) ( 2010.01.05 ) 3rd China Test Conference (CTC'2004) ( 2010.01.04 ) 10th China Fault-Tolerant Computing Symposium (CFTCS'2003) ( 2010.01.03 )
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Ms.Tao Lv "An Observability Branch Coverage Metric Based on Dynamic Factored Use-Define Chains" ( 2006.10.18 ) Mr. Lei Zhang "Design & Test of Network-on-Chip" ( 2006.04.13 ) Mr. Lingyi Liu "ATPG-Based Unbounded Model Checking" ( 2006.03.23 )
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IEEE Test Technology Technical Council(TTTC)
IEEE Asian Test Symposium (ATS)
IEEE Workshop on RTL and High-Level Testing

National Natural Science Foundation of China
National Basic Research Program of China (973)
Prof. Shiyi Xu at Shanghai University
Prof. Shiyuan Yang at Tsinghua Univ.
Prof. Yihe Sun at Tsinghua Univ.
Prof. Jinian Bian at Tsinghua Univ.
Prof. Dong Xiang at Tsinghua Univ.
Prof. Huaguo Liang at Hefei U. of Tech.
Prof. Xiaozong Yang at Harbin U. of T.
Prof. Jianhui Jiang at Tongji University
Prof. Dafang Zhang at Hunan Univ.
Prof. Yigang He at Hunan University
Prof. Huanguo Zhang at Wuhan Univ.

Joint Research Lab. for Advanced Test Technology, Institute of Computing Technology, CAS
No.6, KeXueYuan South Road, Haidian District, Beijing, 100080, China
Tel : (8610) 62600717E-mail : yinhes@ict.ac.cn

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